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1/ Makers could use FPGA or chipset sticking to older technologie (= bigger line like 110 or 130 nm tech instead of shifting to 65 or 90 nm chip) which use higher voltage and are less error prone.
2/ There are chipset design that are resistant to such issue.
While the cost is higher (test and design, more surface in the chip), it include redundant unit that does the calculation and detect any discrepancy between the multiple unit.
Of course the unit tries to be as far away as possible from each other, so the probably of two high energy particules hitting both circuit giving both the same result would be VERY VERY low...
Ex. Leon3 FT (Fault Tolerant), GPL VHDL cpu...
http://www.gaisler.com/cms4_5_3/index.php?option=com_content&task=view&id=13&Itemid=53
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This news makes me glad that I am driving a banged-up Toyota. Apparently, newer car models are more prone to the possibility of being damaged by 










